The integrated SPM and Raman system is a combination of the Nanonics MultiView 4000 and Renishaw inVia laser Raman spectrometer. The MultiView 4000 is a multi scanning probe system with an open platform for integration with a Raman spectrometer. The system is configured for dual probes set-up that allows multiple probe SNOM measurement and other SPM imaging. The Renishaw inVia Raman spectrometer is a fully automated laser Raman spectroscopy configured with three laser lines of 532 nm, 633 nm and 785 nm. This allows spectroscopy and analysis of variety of materials from bio-chemical to semiconductor materials. The combined capability of both systems makes it a powerful nano-characterisation tool for nanoscience research activities such as carbon nanotubes, semiconductor nanowires and nanodots devices. The integrated SPM-Raman system can be used for:
- Atomic Force Microscopy (AFM)
- Contact, non-contact and intermittent-contact Mode
- Phase Imaging
- Spreading Resistance and Conductive Microscopy
- Scanning Near Field Optical Microscopy
- Tip Enhanced Raman Spectroscopy
- Confocal Microscopy
- Confocal Raman Microscopy
- Far field and near field Raman micro-spectroscopy
- High speed surface strain and defect mapping
